IEEE Design & Test of Computers (Zeitschrift)
- Weitere Namensformen
- ACIS (Abkürzung); (Association of Computer and Information Science); (IEEE Computer Society); Computer Society (Institute of Electrical and Electronics Engineers); (IEEE Computer Society); Computer Society of the IEEE (IEEE Computer Society); CS (Abkürzung); (Computer Society); (IEEE Computer Society); Design & Test (IEEE Design & Test of Computers); I.E.E.E. Computer Society (IEEE Computer Society); IEEE (Abkürzung); (Institute of Electrical and Electronics Engineers); IEEE Computer Society (New York); (IEEE Computer Society); IEEE Computer Society (XX.XX.1971 - XX.XX.XXXX); IEEE Computer Society, IEEE Design & Test of Computers (Zeitschrift); IEEE CS (Abkürzung); (IEEE Computer Society); IEEE Institute of Electrical and Electronics Engineers (Institute of Electrical and Electronics Engineers); IEEE Society on Computers (IEEE Computer Society); Institute of Electrical & Electronics Engineers (Institute of Electrical and Electronics Engineers); Institute of Electrical and Electronic Engineers (Institute of Electrical and Electronics Engineers); Institute of Electrical and Electronics Engineering (Institute of Electrical and Electronics Engineers); Institute of Electrical and Electronics Engineers (01.01.1963 -); Institute of Electrical and Electronics Engineers, IEEE Design & Test of Computers (Zeitschrift); (IEEE Design & Test of Computers (Zeitschrift)); Institute of Electrical and Electronics Engineers. Computer Society (IEEE Computer Society); Instituto de Ingenieros Electricistas y Electrónicos (Institute of Electrical and Electronics Engineers); IEEE Design & Test (IEEE Design & Test of Computers (Zeitschrift)); Magazin (IEEE Design & Test of Computers (Zeitschrift)); magazine (IEEE Design & Test of Computers (Zeitschrift)); Sociedad de Computación (IEEE Computer Society); Sociedad de Computación del IEEE (IEEE Computer Society); Society of Computers (IEEE Computer Society); Society on Computers (IEEE Computer Society); United States (US); United States of America (USA); Vereinigte Staaten von Amerika (USA)
- Lebens- und Wirkungsorte
-
New York, NY
USA (XD-US)
- Wirkungszeit
-
XX.XX.1984 - XX.XX.19XX
- übergeordnete Institution
- URL
- https://en.wikipedia.org/wiki/IEEE_Design_%26_Test_of_Computers
- Bemerkung
-
- ISSN: 2168-2356 - OCLC number: 57216796 - keine GND (Stand 12.11.2018)
- Artikel der Institution