- Autor(in)
- Referenz
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(Sov. Phys. JETP 50 (1979) 613)
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- Seitenbereich
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0125 - 0133
- Schlagwort(e)
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<KWD>Ising model
Corner transfer matrix
Critical behaviour
Defect
Magnetization
- Zusammenfsg.
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We consider a planar Ising model with an extended defect described by couplings of the form <I>K</I>(<I>r</I>) = <I>K</I>·(1 + <I>A/r</I>). We determine the spectrum of the corner transfer matrix numerically and analytically and use it to calculate the local magnetization at the defect and the corresponding, non-universal critical exponent.
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- Forschungsartikel